Design for testing or design for testability (DFT) consists of IC design techniques that add testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware. The purpose of manufacturing tests is to validate that the product hardware contains no manufacturin...
Design for testing or design for testability (DFT) consists of IC design techniques that add testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware. The purpose of manufacturing tests is to validate that the product hardware contains no manufacturin...
Introduction to Digital VLSI Design Flow
1h 71 minHigh Level Design Representation
57mTransformations for High Level Synthesis
57mScheduling Algorithms-1
57mIntroduction to HLS: Scheduling, Allocation and Binding Problem
57mScheduling Algorithms-2
1h 70 minBinding and Allocation Algorithms
1h 67 minTwo level Boolean Logic Synthesis-1
1h 63 minTwo level Boolean Logic Synthesis-2
1h 63 minTwo level Boolean Logic Synthesis-3
1h 63 minHeuristic Minimization of Two-Level Circuits
1h 63 minFinite State Machine Synthesis
1h 63 minMultilevel Implementation
1h 63 minEquivalence between CTL Formulas
1h 68 minTemporal Logic: Introduction and Basic Operators
1h 60 minSyntax and Semantics of CTL
1h 60 minIntroduction to formal methods for design verification
1h 60 minModel Checking with Fairness
57mModel Checking Algorithms II
57mIntroduction to Model Checking
57mModel Checking Algorithms I
57mSymbolic Model Checking
1h 61 minOrdered Binary Decision Diagram for State Transition Systems
1h 61 minOperation on Ordered Binary Decision Diagram
1h 61 minOrdered Binary Decision Diagram
1h 61 minBinary Decision Diagram: Introduction and construction
1h 61 minFault Equivalence
57mFunctional and Structural Testing
57mIntroduction to Digital VLSI Testing
57mFault Simulation-1
59mFault Simulation-2
59mFault Simulation-3
59mTestability Measures (SCOAP)
59mD-Algorithm-2
1h 65 minD-Algorithm-1
1h 65 minIntroduction to Automatic Test Pattern Generation (ATPG) and ATPG Algebras
1h 65 minScan Chain based Sequential Circuit Testing-2
52mScan Chain based Sequential Circuit Testing-1
52mATPG for Synchronous Sequential Circuits
52mMemory Testing-2
1h 72 minMemory Testing-1
1h 72 minBuilt in Self Test-2
1h 72 minBuilt in Self Test-1
1h 72 min